Single-crystal X-ray diffraction (SC-XRD) is often referred to as the gold standard of sample characterisation, offering three-dimensional structure of both molecules and their crystalline packing, ...

Could you start by explaining your background in crystallography and how you began using the Rigaku Synergy-ED system? Fraser: I began my journey into crystallography at the University of Edinburgh in ...

This article has been updated in January 2024. High resolution images of microscopic samples can be obtained experimentally using Scanning Electron Transmission Microscopy (STEM). It is an effective ...

In geology, electron backscatter diffraction (EBSD) is a powerful tool for the observation and analysis of microstructures and for phase identification. The EBSD system, by Oxford Instruments, ...

Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs.

The perpetual march toward smaller features, coupled with growing demand for better reliability over longer chip lifetimes, has elevated inspection from a relatively obscure but necessary technology ...

MapSweeper software revolutionizes EBSD analysis by overcoming traditional indexing limitations, enhancing accuracy and speed in materials characterization.