Modern-day high-volume semiconductor manufacturing is a complex process that spans numerous stages and nodes. And with the ever increased focus on quality and cost, the manufacturing supply chain is ...
SAN JOSE, Calif. — CyberOptics Semiconductor Inc. announced the availability of new wafer mapping sensors in a smaller package. The EX-QS features the same capabilities as the company’s standard ...
Genmark Automation said it has added a built-in wafer-mapping sensor to its wafer handlers to increase system throughput and provide flawless wafer transfer. The Global Positioning Robot Swap-Master ...
As one of the most popular tools used today to analyze data in the semiconductor manufacturing process, wafer-mapping software is capable of calculating reasons of yield loss, as well as identify the ...
WESTWOOD, Mass.--(BUSINESS WIRE)--Oct. 26, 2005--ADE Corporation (Nasdaq: ADEX) today announced that the leading expert in wafer polishing, Peter Wolters AG, has purchased and installed a ...
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Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Zeta™-388 is a fully automated wafer ...
Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...
Agilent Technologies recently announced that it will partner with National Nano Device Laboratories (NDL) on wafer mapping tool development, aiming to shorten the testing time for high-frequency ...
Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...
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