Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

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Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

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A team of researchers has developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes they call 3DTIPs. AFM technology allows scientists to observe, measure, and ...

A team of researchers from NYU Abu Dhabi's Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes ...

PI (Physik Instrumente) L.P. – a leading manufacturer of piezo nanopositioning systems and piezo scanners for microscopy, bio-medical and nanotechnology applications – has released a new catalog on ...

For a long time, researchers contested the presence of microscopic pathogens suspected of causing various diseases in plants and animals. The invention of the electron microscope in 1933 made them ...