Semiconductor Engineering

A New Dimension In Optical CD

One of the biggest challenges for nanoscale fabrication is how to measure devices on such a minute scale. As the semiconductor industry demands ever smaller devices, the need for reliable, robust ...
Nanowerk

Critical Dimension Scanning Electron Microscopy (CD-SEM): Precision Metrology for Nanoscale Fabrication

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...
Seeking Alpha

Nano Dimension Announces Breakthrough in Materials Critical for Additively Manufactured Electronics

Waltham, Mass., Nov. 14, 2023 (GLOBE NEWSWIRE) -- Nano Dimension Ltd. (NNDM) (“Nano Dimension”, “Nano”, or the “Company”), a leading supplier of ...
Semiconductor Engineering

Smaller Geometries, Bigger Demands: The Role Of OCD In GAA Logic And Vertical Gate DRAM Process Control

AI workloads are pushing the boundaries of compute, memory, and interconnect architectures, and to meet these goals, manufacturers are rapidly accelerating advanced logic and DRAM development. Chief ...