In integrated circuit manufacturing, chemical mechanical polishing (CMP) is used to control the surface roughness of wafers and other substrates—a key factor influencing the reliability of final ...
With the advancement of nanotechnology, understanding surface properties at the nano- and sub-nanoscale has become increasingly important. Characteristics such as topography and roughness play a ...
Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...
An intrinsic limitation in AFM imaging is that only the surface topography can be acquired, and the AFM tip is too large to resolve details below the nanometer scale. To facilitate the interpretation ...
If using the AFM alone, one cannot observe that only one of these surfaces has a successful monolayer. Photo-induced Force ...
What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...
Sponsored by Park SystemsReviewed by Olivia FrostJun 13 2025 With the advancement of nanotechnology, understanding surface properties at the nano- and sub-nanoscale has become increasingly important.
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