Electronic Design

What’s The Difference Between ATPG And Logic BIST?

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...
Semiconductor Engineering

Improve Logic Test With A Hybrid ATPG/BIST Solution

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
Electronic Design

Combining Logic BIST and Scan Test Compression

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...
EDN

New test points slash ATPG test pattern count

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...
EDN

How to generate test patterns to detect FinFET defects

The size and performance advantages of FinFETs are leading to a general industry adoption of these 3D transistors at the more advanced technology nodes. These complex transistors, however, exacerbate ...
InfoQ

Functional GUI Testing Automation Patterns

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...