TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope TM, ...
The JEOL 1400 High Contrast Transmission Electron Microscope is a state-of-the-art imaging system designed for high-resolution transmission electron microscopy (TEM). This microscope features advanced ...
JEOL, in partnership with San Joaquin Delta Colleges School of Electron Microscopy, has configured remote viewing and remote-control microscopy on Delta’s innovative 1400Flash. The 1400Flash marks an ...
The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of ...
The University of Oxford’s Department of Materials has introduced a custom-built £3 million Transmission Electron Microscope (TEM), marking a significant advancement in microscopy. The JEOL ...
JEOL USA has demonstrated wireless remote-control capability for its transmission electron microscopes. As shown in the picture (courtesy of JEOL USA), the company's Dr. Thomas Isabell, assistant TEM ...
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