ANAHEIM, Calif.--(BUSINESS WIRE)--IRPS Conference --IROC Technologies ®, developers of the industry standard for integrated circuit (IC) soft error analysis and ...

Keithley Instruments has announced the S510, a high-channel-count, turnkey semiconductor reliability test system for use in lifetime modeling of advanced ULSI CMOS processes at the 65-nm node and ...

MUNICH--(BUSINESS WIRE)--Cadence Design Systems, Inc. (NASDAQ: CDNS) today introduced the Cadence ® Legato™ Reliability Solution, the industry’s first software product that meets the challenges of ...

Yokogawa Electric Corp. has developed a flat panel display (FPD) driver IC test system that supports high-speed interfaces. The ST6731, which will be available in March 2011, that supports interfaces ...

Chip reliability is coming under much tighter scrutiny as IC-driven systems take on increasingly critical and complex roles. So whether it’s a stray alpha particle that flips a memory bit, or some ...

Experts at the Table: Semiconductor Engineering sat down to talk about silicon lifecycle management, how it’s expanding and changing, and where the problems are, with Prashant Goteti, principal ...

As IC electronics have become more densely packed, cross-talk among them has become a problem As IC electronics have become more densely packed, cross-talk among them has become a problem. One means ...

The move to environmentally sound RoHS-compliant products poses a number of significant challenges to the electronics industry. One of the most important is the move to higher solder process ...

This file type includes high resolution graphics and schematics when applicable. In high-performance semiconductors, the back-end-of-line (BEOL) interconnect pitch has been shrinking for decades ...

Power Integrations’ 1700 V Switcher IC Delivers Reliability and Space-Saving Benefits in 800 V BEVs Performance of InnoSwitch™3-AQ flyback IC demonstrated in new reference designs featuring ...