Failure analysis of ICs requires a quick and proper response because, of course, helping a customer is our main concern. But should we expect the quality assurance (QA) department to test every ...

In advanced semiconductor manufacturing, inspection and FA are not overhead—they are economic control mechanisms that protect ...

Not all defects are visible with the same microscope. Explore how resolution, contrast, and signal interpretation shape semiconductor failure investigations.

Czech-based electron microscope manufacturer TESCAN is undergoing a strategic shift, expanding into advanced semiconductor packaging through its growing expertise in failure analysis (FA) technology.

When a chip malfunctions it’s the job of the failure analysis engineer to determine how it failed or significantly deviated from its key performance metrics. The cost of failure in the field can be ...