Tokyo, Japan — Advantest Corp. has introduced the M7522 dynamic test handler, which offers the industry's highest processing speed and positioning accuracy for fine-pitch tape automated bonding (TAB) ...
ATC 2.0 Option Enables Dynamic Multisite Sensing and Regulation of Device Temperature for Optimized Test of High-End Automotive SoCs TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test ...
Tokyo—Advantest Corp. has announced its M6242 dynamic test handler that provides throughput of 42,200 units per hour for high-volume production test of memory devices such as DRAM. The M6242 supports ...
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