Engineers are beginning to appreciate that, from prototypes early in the design cycle through to final system test, a digital pattern generator (DPG) speeds up system debug and therefore shortens the ...

CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

Large digital integrated circuits are becoming harder to test in a time- and cost-efficient manner. AI chips, in particular, have tiled architectures that are putting pressure on older testing ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Siemens Digital Industries Software today introduced Tessent™ AnalogTest software - an innovative solution that reduces pattern generation time for analog circuit tests from months to days. The ...

Siemens Digital Industries Software has introduced Tessent AnalogTest software -- an innovative solution that reduces pattern generation time for analog circuit tests from months to days. The solution ...