Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
4D STEM is currently used in many TEM projects and is for sure on every electron microscopist’s “must-watch” list. Recent advancements in TEM technology, particularly the hybrid-pixel direct electron ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback