Unlike Scanning Electron Microscopy that bounces electrons off the surface of a sample to produce an image, Transmission Electron Microscopes (TEMs) shoot the electrons completely through the sample.

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...

During chemical reactions, atoms in the reacting substances break their bonds and re-arrange, forming different chemical products. This process entails the movement of both electrons (i.e., negatively ...

AES operates on the principle of the Auger effect, named after the French physicist Pierre Auger. When a material's surface is bombarded with a beam of high-energy electrons or photons, it causes the ...

It may not have won an Oscar, but the tiny electron has finally made its film debut. A new video shows how an electron rides on a light wave after just having been pulled away from an atom. This is ...

Carbon nanotube field emitters are at present the brightest available electron sources but must operate at low currents to avoid Coulomb expansion and are therefore not suitable for ultrafast imaging.