Sample preparation will vary depending on the sample, imaging mode, and size of desired images. You will likely need to do a literature search to find the preparation best for your sample. Smaller ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

New research demonstrates that novel probe technology based on flexible membranes can replace conventional atomic force microscopy (AFM) cantilevers for applications such as fast topographic imaging, ...

This article introduces Park Systems' latest large-sample atomic force microscope (AFM), the FX200—engineered to support both foundational studies and advanced research applications. Designed for ...

This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...

A team of researchers has developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes they call 3DTIPs. AFM technology allows scientists to observe, measure, and ...

The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...

AzoMaterials speaks to Cassandra Phillips and Qichi Hu from Bruker about how their new Resonance-Enhanced Force Volume AFM-IR technology overcomes the limitations of conventional nanoscale ...

For a long time, researchers contested the presence of microscopic pathogens suspected of causing various diseases in plants and animals. The invention of the electron microscope in 1933 made them ...