Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...

AFM is particularly well-suited to working with soft materials in the field of nanomechanical measurements, owing to its piconewton force resolution and sub-nanometer vertical displacement accuracy.

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force ...

AzoMaterials speaks to Cassandra Phillips and Qichi Hu from Bruker about how their new Resonance-Enhanced Force Volume AFM-IR technology overcomes the limitations of conventional nanoscale ...

For a long time, researchers contested the presence of microscopic pathogens suspected of causing various diseases in plants and animals. The invention of the electron microscope in 1933 made them ...